Industrial Film Thickness Measurement
High-precision film thickness measurement solutions designed specifically for industrial environments, suitable for various demanding production conditions
NS-20 Manual Film Thickness Gauge
A reflective micro film thickness measurement and analysis system independently developed by Acuitik, using white light interference technology to achieve non-contact, non-destructive nanometer-level film thickness measurement. Suitable for semiconductor, photovoltaic, display panel industries, providing comprehensive solutions from laboratory to production line.
- Measurement range: 1nm - 260μm (extendable to 3000μm)
- Measurement accuracy: ±0.5nm
- Repeatability: 0.01nm (100 measurements standard deviation)
- Supports up to 100-layer film analysis
- Portable design, suitable for laboratory and production line
NS-30 Automatic Film Thickness
Fully automatic high-precision film thickness measurement system, designed for production line quality control, supporting automatic sample stage and batch measurement, providing efficient and stable measurement performance. Suitable for industrial applications requiring high throughput.
- Automated measurement process, supports automatic sample stage
- Optional AcuiTik® AI+ high-speed mode, speed up to 1000 points/sec+
- Production line integration, supports SECS/GEM communication protocol
- Measurement range: 1nm - 260μm (extendable to 3000μm)
- Measurement accuracy: ±0.5nm
- Repeatability: 0.01nm
NS-Micro Microscope Film Thickness Gauge
A microscopic spectral system designed specifically for "Micro-spot" film thickness measurement, which can easily upgrade a standard microscope into a professional film thickness analysis instrument. Suitable for micro-electronics and optoelectronic device micro-area film thickness measurement.
- Minimum spot size down to 1μm
- High precision measurement, repeatability up to 0.02nm
- Easy integration with existing microscope systems
- Measurement range: 1nm - 200μm
- Supports up to 100-layer film analysis
NS-Touch Curved Surface Film Thickness Gauge
Portable curved surface film thickness measuring instrument, designed for complex curved and non-planar samples. Using unique optical design, it can perform precise film thickness measurement on spherical, aspheric, free-form surfaces and other complex shapes.
- Portable design, supports handheld operation
- Curved surface measurement capability, supports spherical/aspheric measurement
- Lens coating AR, HC, hydrophobic layer measurement
- Measurement range: 10nm - 260μm
- Supports up to 100-layer film analysis
NS-HR Thick Film Gauge
High-precision measuring instrument designed specifically for thick film measurement, using multi-wavelength light source and optimized algorithm to perform precise measurement of thick films from 4μm to 3000μm. Suitable for coatings, composite materials and other thick film application scenarios.
- Wide measurement range: 4μm - 3000μm (thick film mode)
- High precision thick film measurement, accuracy up to 5nm
- Stable and reliable performance, suitable for industrial environments
- Supports up to 100-layer film analysis
- Multi-wavelength light source, adaptable to different materials
NS-100 High-Speed Line Scan Film Thickness Gauge
Using innovative high-speed line scan technology, it can scan the entire sample at once and directly generate a complete thickness distribution map (Mapping). Measurement speed is over 100 times faster than traditional single-point measurement methods.
- Line scan technology, speed over 100x faster than single-point
- Direct Mapping output, no stitching required
- Spectral range: 380 - 1700 nm
- 12" wafer full scan < 10 minutes
- Can be integrated into automated production lines
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We also provide scientific research-grade film thickness measurement and film thickness sensor solutions to meet your diverse needs