Reflective Film Thickness Measurement Analysis System NanoSense

NS-100
High-Speed Line Scan Film Thickness Gauge

Using innovative high-speed line scan technology, can scan the entire sample at once and directly generate complete thickness distribution map (Mapping). Measurement speed is over 100 times faster than traditional single-point measurement methods, designed specifically for industrial high-speed detection scenarios.

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NS-100 High-Speed Line Scan Film Thickness Gauge

Core Features

NS-100 uses revolutionary line scan technology, redefining the speed and efficiency of industrial film thickness measurement

100x Speed Improvement

Scanning entire sample film thickness is over 100 times faster than single-point measurement methods, greatly improving production efficiency

Direct Mapping Output

Line scan entire sample, directly output complete thickness distribution map, no stitching processing needed

Wide Spectral Range

Measurement wavelength range covers 380 to 1700 nanometers, meeting various material measurement needs

Production Line Integration

Can be customized and integrated into automated production lines, supporting online real-time detection

Ultra-Fast Detection

12-inch wafer full scan requires only 3 scans to present complete map, completed in less than 10 minutes

High Reliability

Industrial-grade design, supports 7×24 hours continuous operation, meeting demanding production environment requirements

Technology Comparison

NS-100 Line Scan Technology vs NS-30 Single-Point Mapping Technology

NS-30 Mapping

Traditional single-point measurement technology

Measurement Method

Single-point measurement then stitched into map

12-inch Wafer Full Scan Time

70,000 test points takes >48 hours

Limitation: Requires point-by-point measurement movement, time-consuming, not suitable for high-volume rapid detection scenarios

Recommended

NS-100 Line Scan Map

Innovative high-speed line scan technology

Measurement Method

Line scan entire sample, directly output map

12-inch Wafer Full Scan Time

3 scans to present complete map, completed in <10 minutes!

Advantage: Speed improvement over 100 times, suitable for high-volume online rapid detection, significantly improving production efficiency

Application Fields

NS-100 is widely used in semiconductor manufacturing, photovoltaics, display panels and other fields requiring high-speed batch inspection

Semiconductor Wafer Inspection

  • 12-inch wafer full-surface film thickness uniformity inspection
  • Advanced process thin film process monitoring
  • Mass production line online quality control

Photovoltaic Cell Inspection

  • Large-area cell anti-reflection coating inspection
  • TOPCon/HJT new cell film thickness distribution
  • Rapid full inspection before module packaging

Display Panel Inspection

  • LCD/OLED color filter film thickness
  • Large-size panel coating uniformity evaluation
  • Touchscreen ITO thin film inspection

Technical Specifications

NS-100 High-Speed Line Scan Film Thickness Gauge Detailed Specifications

NS-100 Specifications

Product Type Reflective Film Thickness Measurement Analysis System (High-Speed Line Scan)
Spectral Range 380 nm – 1700 nm
Measurement Method Line scan entire sample, direct mapping output
Speed Advantage Over 100 times faster than single-point measurement
Typical Application 12-inch wafer full scan completed in <10 minutes
Integration Capability Can be customized and integrated into automated production lines
Applicable Industries Semiconductor, Photovoltaics, Display Panels, Optical Coating

Why Choose NS-100?

<10min

Ultra-Fast Detection

12-inch wafer full scan takes less than 10 minutes, compared to over 48 hours with traditional methods

100×

Efficiency Improvement

Over 100 times efficiency improvement compared to single-point measurement, significantly reducing inspection costs

24/7

Continuous Operation

Industrial-grade stability design, supports 7×24 hours continuous operation, meeting mass production requirements

Ready to Improve Your Inspection Efficiency?

Contact our technical team to get detailed solutions and quotes for NS-100 High-Speed Line Scan Film Thickness Gauge

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