Highly integrated design that brings precision measurement technology into an ultra-compact form factor, providing powerful film thickness analysis for space-constrained environments.
NS-Micro integrates multiple innovative technologies from Acuitik, providing complete film thickness measurement solutions for space-constrained environments
Volume only 1/3 of traditional equipment, easily integrated into various space-constrained environments
Measurement accuracy up to ±0.5nm, maintaining excellent performance in a compact form factor
Single point measurement in just 1 second, supporting continuous rapid scan measurements
Rich SDK and API for easy integration with automated production lines or other equipment
NS-Micro Microscope Film Thickness Gauge offers four different wavelength configurations to meet various application needs
NS-Micro provides excellent spot size flexibility, adjustable from 1μm to 100μm
Minimum spot size, suitable for micro-nano structures and small area measurements
Adjustable spot size to meet measurement needs of different application scenarios
Maximum spot size, suitable for larger area uniformity measurements
NS-Micro Microscope Film Thickness Gauge is widely used in various scenarios requiring compact measurement solutions
Provides high-precision film thickness measurement capability for space-limited R&D laboratories, supporting new material development and process optimization.
Suitable for universities and vocational education institutions for teaching demonstrations, allowing students to intuitively understand thin film measurement technology principles.
Can be integrated into automated production lines for real-time film thickness monitoring and quality control at key process points.
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