WS2 折射率

WS2 的光学常数 (n, k) 数据，涵盖 0.36 – 1.70 μm 波长范围。

波长范围 0.365 – 1.700 μm
数据点 1336

关键波长处的光学常数

632.8 nm (He-Ne)
n = 3.9630
k = 0.2717
589.3 nm (Na-D)
n = 2.5850
k = 0.5560
532 nm
n = 4.0120
k = 0.5058
1550 nm (通讯)
n = 2.7450
k = 0.0000

n, k 色散曲线

数据表（采样）

波长 (μm) n k
0.36502.402002.77500
0.39803.170002.74000
0.43104.092002.41900
0.46404.133001.05100
0.49703.637000.96680
0.53004.035000.57000
0.56303.321000.12810
0.59602.467001.09500
0.62904.058000.35520
0.66203.559000.07378
0.69503.352000.03149
0.72803.230000.01761
0.76103.146000.01129
0.79403.083000.00786
0.82703.034000.00577
0.86002.995000.00439
0.89302.962000.00343
0.92602.934000.00273
0.95902.911000.00220
0.99202.891000.00179
1.02502.873000.00147
1.05802.857000.00122
1.09102.843000.00101
1.12402.831000.00083
1.15702.820000.00069
1.19002.810000.00057
1.22302.801000.00047
1.25602.793000.00038
1.28902.786000.00031
1.32202.779000.00025
1.35502.773000.00020
1.38802.767000.00015
1.42102.762000.00012
1.45402.757000.00009
1.48702.753000.00006
1.52002.748000.00004
1.55302.745000.00003
1.58602.741000.00002
1.61902.738000.00001
1.65202.734000.00000
1.68502.732000.00000
1.70002.730000.00000

上表为采样数据（共 1336 个数据点），点击"下载完整 CSV"获取全部数据。

数据说明

Optical constants of monolayer WS2 were measured by spectroscopic ellipsometry in the spectral range 365–1700 nm. WS2 samples were grown on sapphire by atmospheric pressure chemical vapor deposition and then transferred on silicon wafers covered by 295 nm SiO2. Tauc–Lorentz oscillators were used in ellipsometry model to describe the optical response of excitons.

参考文献

G. A. Ermolaev, D. I. Yakubovsky, Yu. V. Stebunov, A. V. Arsenin, V. S. Volkov. Spectral ellipsometry of monolayer transition metal dichalcogenides: Analysis of excitonic peaks in dispersion. J. Vac. Sci. Technol. B 38, 014002 (2020) (Numerical data kindly provided by Georgy Ermolaev)

相关材料（主要）

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

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