Te 折射率

Te 的光学常数 (n, k) 数据，涵盖 0.20 – 2.00 μm 波长范围。

波长范围 0.200 – 2.000 μm
数据点 278

关键波长处的光学常数

632.8 nm (He-Ne)
n = 4.2550
k = 2.4340
589.3 nm (Na-D)
n = 3.9070
k = 2.7230
532 nm
n = 3.2410
k = 2.8780
1550 nm (通讯)
n = 4.5790
k = 0.1610

n, k 色散曲线

数据表（采样）

波长 (μm) n k
0.20001.519001.08900
0.20391.491001.08800
0.20811.463001.09300
0.21231.436001.10600
0.21681.410001.12400
0.22141.388001.14800
0.22631.368001.17500
0.23131.351001.20500
0.23661.334001.23700
0.24221.318001.27300
0.24801.301001.31300
0.25411.283001.36200
0.26051.268001.42000
0.26721.259001.48800
0.27431.258001.56600
0.28181.270001.65000
0.28971.295001.73800
0.29811.332001.82500
0.30691.380001.90900
0.31631.435001.99100
0.32631.496002.07100
0.33701.564002.15300
0.34831.642002.23600
0.36051.731002.32000
0.37351.833002.40100
0.38751.947002.47900
0.40262.072002.55400
0.41892.212002.62600
0.43662.369002.69200
0.45592.543002.74600
0.47692.729002.79300
0.50002.937002.83900
0.52543.192002.87600
0.55363.506002.86200
0.58493.850002.75200
0.62004.166002.53000
0.65964.394002.22200
0.70464.501001.88800
0.75614.497001.59800
0.81584.434001.40900
0.88574.406001.33000
0.96884.498001.28400
1.06904.690001.12500
1.19234.819000.79800
1.34784.766000.43100
1.63164.504000.10000
1.93754.284000.00500
2.00004.252000.00200

上表为采样数据（共 278 个数据点），点击"下载完整 CSV"获取全部数据。

数据说明

30 nm-thick tellurium film deposited directly on SiO2 substrate

参考文献

A. Ciesielski, L. Skowronski, W.Pacuski, T. Szoplik. Permittivity of Ge, Te and Se thin films in the 200–1500 nm spectral range. Predicting the segregation effects in silver. Mat. Sci. Semicond. Process. 81, 64-67 (2018) (Numerical data kindly provided by Arkadiusz Ciesielski)

相关材料（主要）

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

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