SiO2 (o) 折射率

SiO2 (o) 的光学常数 (n, k) 数据，涵盖 0.18 – 2.18 μm 波长范围。

波长范围 0.180 – 2.182 μm
数据点 72

关键波长处的光学常数

632.8 nm (He-Ne)
n = 1.5427
k = 0.0000
589.3 nm (Na-D)
n = 1.5437
k = 0.0000
532 nm
n = 1.5476
k = 0.0000
1550 nm (通讯)
n = 1.5276
k = 0.0000

n, k 色散曲线

数据表（采样）

波长 (μm) n k
0.18001.688440.00000
0.20821.637970.00000
0.23641.609930.00000
0.26461.592350.00000
0.29281.580450.00000
0.32101.571960.00000
0.34921.565660.00000
0.37741.560830.00000
0.40561.557030.00000
0.43381.553980.00000
0.46201.551480.00000
0.49021.549400.00000
0.51841.547640.00000
0.54661.546140.00000
0.57481.544840.00000
0.60301.543700.00000
0.63121.542700.00000
0.65941.541800.00000
0.68761.540990.00000
0.71581.540250.00000
0.74401.539580.00000
0.77221.538960.00000
0.80041.538380.00000
0.82861.537840.00000
0.85681.537320.00000
0.88501.536840.00000
0.91321.536370.00000
0.94141.535930.00000
0.96961.535500.00000
0.99781.535090.00000
1.02601.534680.00000
1.05421.534290.00000
1.08241.533900.00000
1.11061.533520.00000
1.13881.533140.00000
1.16701.532770.00000
1.19521.532400.00000
1.22341.532030.00000
1.25161.531670.00000
1.27981.531300.00000
1.30801.530940.00000
1.33621.530570.00000
1.36441.530200.00000
1.39261.529830.00000
1.42081.529460.00000
1.44901.529090.00000
1.47721.528710.00000
1.50541.528340.00000
1.53361.527950.00000
1.56181.527570.00000
1.59001.527180.00000
1.61821.526780.00000
1.64641.526380.00000
1.67461.525980.00000
1.70281.525570.00000
1.73101.525160.00000
1.75921.524740.00000
1.78741.524320.00000
1.81561.523890.00000
1.84381.523460.00000
1.87201.523020.00000
1.90021.522580.00000
1.92841.522120.00000
1.95661.521670.00000
1.98481.521200.00000
2.01301.520730.00000
2.04121.520260.00000
2.06941.519780.00000
2.09761.519290.00000
2.12581.518790.00000
2.15401.518290.00000
2.18221.517780.00000

上表为采样数据（共 72 个数据点），点击"下载完整 CSV"获取全部数据。

数据说明

18 °C

参考文献

1) T. Radhakrishnan. Further studies on the temperature variation of the refractive index of crystals. Proc. Indian Acad. Sci. 31, 22-34 (1951)
2) T. Radhakrishnan. The dispersion, briefringence and optical activity of quartz. Proc. Indian Acad. Sci. 25, 260-265 (1947)

相关材料（主要）

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

需要测量 SiO2 (o) 薄膜厚度？

Acuitik 膜厚测量系统可实现亚纳米级精度的非接触式测量。

查看产品 联系我们