SiO 折射率

SiO 的光学常数 (n, k) 数据，涵盖 0.24 – 2.00 μm 波长范围。

波长范围 0.240 – 2.000 μm
数据点 35

关键波长处的光学常数

589.3 nm (Na-D)
n = 1.9740
k = 0.0010
532 nm
n = 1.9850
k = 0.0106

n, k 色散曲线

数据表（采样）

波长 (μm) n k
0.24001.847000.70000
0.26101.933000.60862
0.28102.051000.52405
0.30002.161000.43000
0.31202.216000.37912
0.32802.246000.31550
0.33802.255000.28717
0.35002.259000.25317
0.36002.255000.22483
0.37002.237000.19650
0.37802.213000.17763
0.38802.180000.15689
0.39702.158000.13822
0.41102.125000.11526
0.42302.096000.09700
0.43202.078000.08558
0.44302.059000.07162
0.45802.041000.05824
0.47102.023000.04992
0.48302.010000.04152
0.50001.999000.02915
0.51601.990000.01555
0.52901.985000.01062
0.54801.979000.00545
0.57001.974000.00100
0.60901.963000.00101
0.66001.949000.00107
0.70001.942000.00112
0.78001.933000.00121
0.82901.926000.00127
0.87201.919000.00132
0.90001.916000.00136
0.96101.912000.00143
1.00001.907000.00147
2.00001.853000.00266

上表为采样数据（共 35 个数据点），点击"下载完整 CSV"获取全部数据。

参考文献

G. Hass and C. D. Salzberg. Optical properties of silicon monoxide in the wavelength region from 0.24 to 14.0 microns. J. Opt. Soc. Am. 44, 181-183 (1954) (Data points extracted from a figure)

相关材料（主要）

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

需要测量 SiO 薄膜厚度？

Acuitik 膜厚测量系统可实现亚纳米级精度的非接触式测量。

查看产品 联系我们