Si 折射率

Float zone c-Si; Heterogenous data processing combining ellipsometric and spectrophotometric measurements with refractive index determined in
B. J. Frey, D. B. Leviton, T. J. Madison.
Temperature-dependent refractive index of silicon and germanium,
Proc. SPIE 6273, 62732J (2006).
Numerical procedures updated in
D. Franta, P. Franta, J. Vohánka, M. Čermák, I. Ohlídal.
Determination of thicknesses and temperatures of crystalline silicon wafers from optical measurements in the far infrared region,
J. Appl. Phys. 123, 185707 (2018).
Temperature 100 K."