Sc2O3 折射率

Sc2O3 的光学常数 (n, k) 数据，涵盖 0.23 – 1.20 μm 波长范围。

波长范围 0.230 – 1.200 μm
数据点 486

关键波长处的光学常数

632.8 nm (He-Ne)
n = 1.9933
k = 0.0000
589.3 nm (Na-D)
n = 1.9981
k = 0.0000
532 nm
n = 2.0071
k = 0.0000

n, k 色散曲线

数据表（采样）

波长 (μm) n k
0.23002.350000.00566
0.25402.260010.00387
0.27802.191500.00264
0.30202.144010.00181
0.32602.109900.00124
0.35002.084650.00085
0.37402.065470.00058
0.39802.050580.00040
0.42202.038790.00027
0.44602.029310.00018
0.47002.021570.00013
0.49402.015160.00009
0.51802.009810.00006
0.54202.005280.00004
0.56602.001420.00003
0.59001.998100.00002
0.61401.995220.00001
0.63801.992710.00001
0.66201.990510.00001
0.68601.988560.00000
0.71001.986830.00000
0.73401.985300.00000
0.75801.983920.00000
0.78201.982680.00000
0.80601.981560.00000
0.83001.980550.00000
0.85401.979620.00000
0.87801.978780.00000
0.90201.978020.00000
0.92601.977310.00000
0.95001.976660.00000
0.97401.976070.00000
0.99801.975520.00000
1.02201.975010.00000
1.04601.974530.00000
1.07001.974090.00000
1.09401.973690.00000
1.11801.973300.00000
1.14201.972950.00000
1.16601.972620.00000
1.19001.972300.00000
1.20001.972180.00000

上表为采样数据（共 486 个数据点），点击"下载完整 CSV"获取全部数据。

数据说明

Stoichiometric 270±5 nm film on SiO2 substrate.

参考文献

A. Belosludtsev, K. Juškevičius, L. Ceizaris, R. Samuilovas, S. Stanionytė, V. Jasulaitienė, S. Kičas. Correlation between stoichiometry and properties of scandium oxide films prepared by reactive magnetron sputtering. Appl. Surf. Sci. 427, 312-318 (2018) (Numerical data kindly provided by Alexandr Belosludtsev)

相关材料（主要）

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

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