PbI2 折射率

PbI2 的光学常数 (n, k) 数据,涵盖 0.42 – 0.79 μm 波长范围。

波长范围 0.423 – 0.794 μm
数据点 1001

关键波长处的光学常数

632.8 nm (He-Ne)
n = 3.1469
k = 0.0001
589.3 nm (Na-D)
n = 3.2273
k = 0.0001
532 nm
n = 3.4509
k = 0.0155

n, k 色散曲线

数据表(采样)

波长 (μm) n k
0.42353.414401.61230
0.43273.478001.34520
0.44203.647801.07820
0.45123.776700.83010
0.46053.736800.61400
0.46973.720200.43870
0.47903.786800.34790
0.48823.842500.48810
0.49753.837000.60500
0.50674.127200.44730
0.51603.650900.07250
0.52523.527100.02520
0.53453.425300.01300
0.54373.353300.00670
0.55303.307500.00330
0.56223.278700.00160
0.57153.258600.00070
0.58073.241900.00030
0.59003.226000.00010
0.59923.209900.00010
0.60853.193400.00010
0.61783.176300.00010
0.62703.158600.00010
0.63633.140300.00010
0.64553.121400.00010
0.65483.102000.00010
0.66403.082100.00010
0.67333.061600.00010
0.68253.040600.00010
0.69183.019200.00010
0.70102.997200.00010
0.71032.974700.00010
0.71952.951800.00010
0.72882.928400.00010
0.73802.904600.00010
0.74732.880300.00010
0.75652.855700.00010
0.76582.830600.00010
0.77502.805200.00010
0.78432.779400.00010
0.79352.753200.00010

上表为采样数据(共 1001 个数据点),点击"下载完整 CSV"获取全部数据。

数据说明

Optical constants derived from reflectance spectra of 10-170 nm PbI2 films on SiO2/Si substrate.

参考文献

R. Frisenda, J. O. Island, J. L. Lado, E. Giovanelli, P. Gant, P. Nagler, S. Bange, J. M. Lupton, C. Schüller, A. J. Molina-Mendoza, L. Aballe, M. Foerster, T. Korn, M. A. Niño, D. Perez de Lara, E. M. Pérez, J. Fernandéz-Rossier, A. Castellanos-Gomez. Characterization of highly crystalline lead iodide nanosheets prepared by room-temperature solution processing. Nanotechnol. 28, 455703 (2017) (Numerical data kindly provided by Andres Castellanos-Gomez)

相关材料(主要)

需要测量 PbI2 薄膜厚度?

Acuitik 膜厚测量系统可实现亚纳米级精度的非接触式测量。