GdF3 折射率

GdF3 的光学常数 (n, k) 数据，涵盖 0.12 – 2.20 μm 波长范围。

波长范围 0.120 – 2.200 μm
数据点 10107

关键波长处的光学常数

632.8 nm (He-Ne)
n = 1.5841
k = 0.0000
589.3 nm (Na-D)
n = 1.5854
k = 0.0000
532 nm
n = 1.5878
k = 0.0000
1550 nm (通讯)
n = 1.5747
k = 0.0000

n, k 色散曲线

数据表（采样）

波长 (μm) n k
0.12002.239900.09982
0.12902.013880.00078
0.13871.886550.00000
0.14911.813680.00000
0.16041.764100.00000
0.17241.728000.00000
0.18541.700600.00000
0.19931.679220.00000
0.21431.662180.00000
0.23051.648410.00000
0.24781.637140.00000
0.26641.627820.00000
0.28651.620070.00000
0.30801.613570.00000
0.33121.608100.00000
0.35611.603480.00000
0.38291.599550.00000
0.41171.596200.00000
0.44271.593330.00000
0.47601.590880.00000
0.51181.588760.00000
0.55031.586940.00000
0.59171.585360.00000
0.63621.583980.00000
0.68411.582780.00000
0.73551.581730.00000
0.79081.580790.00000
0.85031.579960.00001
0.91431.579200.00001
0.98311.578510.00001
1.05701.577870.00001
1.13651.577260.00001
1.22211.576670.00002
1.31401.576100.00002
1.41281.575520.00003
1.51911.574920.00003
1.63341.574290.00004
1.75631.573630.00005
1.88841.572900.00007
2.03041.572110.00008
2.18321.571220.00010
2.19961.571130.00010

上表为采样数据（共 10107 个数据点），点击"下载完整 CSV"获取全部数据。

数据说明

Films GdF3; Deposited by thermal evaporation on c-Si; Five samples with a polycrystalline structure and nominal thicknesses 20–600 nm; Multi-sample method; Heterogenous data processing combining ellipsometric and spectrophotometric measurements; Inhomogeneous layers; Optical constants correspond to the thinest film; Room temperature.

参考文献

D. Franta, J. Vohánka, J. Dvořák, P. Franta, I. Ohlídal, P. Klapetek, J. Březina, D. Škoda. Optical characterization of gadolinium fluoride films using universal dispersion model. Coatings 13, 218 (2023) (Numerical data kindly provided by Daniel Franta)

相关材料（主要）

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

需要测量 GdF3 薄膜厚度？

Acuitik 膜厚测量系统可实现亚纳米级精度的非接触式测量。

查看产品 联系我们