关键波长处的光学常数

632.8 nm (He-Ne)

n = 2.9485

k = 0.2794

589.3 nm (Na-D)

n = 2.9585

k = 0.3185

532 nm

n = 2.9801

k = 0.3857

n, k 色散曲线

数据表（采样）

波长 (μm)	n	k
0.3014	2.47273	1.89384
0.3238	2.91366	1.72454
0.3461	3.14783	1.44281
0.3685	3.31164	1.20072
0.3908	3.40497	0.85103
0.4132	3.25791	0.57175
0.4356	3.10821	0.49631
0.4579	3.04170	0.47295
0.4803	3.01106	0.44876
0.5027	2.99400	0.42186
0.5250	2.98278	0.39376
0.5474	2.97383	0.36569
0.5697	2.96541	0.33905
0.5921	2.95742	0.31527
0.6144	2.95120	0.29490
0.6367	2.94840	0.27685
0.6591	2.94958	0.25868
0.6814	2.95354	0.23797
0.7037	2.95797	0.21353
0.7259	2.96052	0.18566
0.7482	2.95973	0.15562
0.7705	2.95529	0.12493
0.7927	2.94889	0.09432
0.8150	2.94024	0.05441
0.8372	2.90301	0.01728
0.8594	2.86704	0.00886
0.8815	2.84297	0.00597
0.9037	2.82405	0.00397
0.9258	2.80824	0.00260
0.9479	2.79470	0.00168
0.9700	2.78293	0.00108
0.9921	2.77259	0.00068
1.0390	2.75419	0.00026
1.0869	2.73920	0.00009
1.1348	2.72692	0.00003
1.1827	2.71665	0.00001
1.2306	2.70792	0.00000
1.2785	2.70040	0.00000
1.3264	2.69384	0.00000
1.3744	2.68808	0.00000
1.4224	2.68297	0.00000
1.4705	2.67842	0.00000
1.4979	2.67602	0.00000

上表为采样数据（共 583 个数据点），点击"下载完整 CSV"获取全部数据。

数据说明

A CdTe film was deposited on to a soda-lime glass substrate using RF magnetron sputtering. A variable-angle ellipsometer was used to take amplitude and phase change measurements. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm

参考文献

R. E. Treharne, A. Seymour-Pierce, K. Durose, K. Hutchings, S. Roncallo, D. Lane, Optical design and fabrication of fully sputtered CdTe/CdS solar cells. J. Phys: Conf. Ser. 286, 012038, (2011) (Numerical data kindly provided Dr. Robert Treharne)

CdTe 折射率

关键波长处的光学常数

n, k 色散曲线

数据表（采样）

数据说明

参考文献

相关材料（主要）

需要测量 CdTe 薄膜厚度？

CdTe 折射率

关键波长处的光学常数

n, k 色散曲线

数据表（采样）

数据说明

参考文献

相关材料（主要）

需要测量 CdTe 薄膜厚度？

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