The normal incident reflection film thickness measurement method is simple in principle and easy to operate. It can measure the thickness of single or multiple layers in the range of one nanometer to one millimeter.
AcuiTik was established by multiple Ph.D.s and master’s degree holders from top universities such as Berkeley, Fudan University, Shanghai Jiao Tong University, and ShanghaiTech University. The team has been dedicated to the fields of semiconductor equipment, smart manufacturing, and precision measurement technologies for years, accumulating extensive research and industrial experience.
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