On January 14, 2026, T/CIET 2298-2026 "Calibration Specification for Thin Film Interference Film Thickness Measurement Systems" was officially released and implemented by the China Association for the Promotion of International Economic and Technical Cooperation. This specification targets spectroscopic interference thin film thickness measurement systems, clarifying technical requirements for measurement characteristics, calibration conditions, calibration items, calibration methods, and result expression, providing unified calibration standards for the industry.
Acuitik, as a professional domestic film thickness measurement equipment manufacturer, was invited to participate in the drafting of this specification. With years of technical accumulation and practical experience in the field of optical precision measurement, Acuitik provided important technical support and professional suggestions for the formulation of the specification.
Specification Significance
The release and implementation of this specification will effectively improve the standardization level of calibration for thin film interference film thickness measurement systems, ensure the accuracy and reliability of measurement results, and provide strong metrological technical support for the development of semiconductor, photovoltaic, optical coating and other industries.
In the future, Acuitik will continue to leverage its technical advantages, actively participate in industry standard formulation, promote the standardization and industrialization of domestic high-end film thickness measurement technology, and contribute to the development of China's precision measurement field.