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The NS-Touch series is an advanced handheld thin film measurement system with significant price advantages. It can quickly analyze the reflection spectral data of thin films within seconds and provide measurement thickness, capable of measuring single and multiple layers.
AR Coating Thickness Measurement
It’s simple to measure anti-reflective coatings on curved eyeglass and other optical lenses.
Hard Coating Measurement
Simultaneously measure the thickness of hard coatings and primer layers.
Hydrophobic Layer Thickness Measurement
Hydrophobic layers are incredibly thin, about the thickness of a hundred atoms, necessitating the use of short-wavelength UV light for the most precise measurements.
NS-Touch Features
•Effortless Calibration: the AutoCal algorithm frees user from the daily hassle of calibration.
•Enhanced Accuracy: minimize back reflection interference, ensuring that the measurements are more precise and reliable.
•User-Friendly Operation: Benefit from an automatic sample detection algorithm that makes the measurement process intuitive and easy to use.
NS-Touch Series Specifications
| Model Type | NS-TouchUV | NS-Touch | NS-Touch NIR |
| Wavelength Range | 190 nm – 1100 nm | 380 nm – 1050 nm | 950 nm – 1700 nm |
| Thickness Measurement Range1 | 0.02 μm – 40 μm | 0.05 μm – 80 μm | 0.1 μm – 250 μm |
| Accuracy2 | 0.01 μm or 0.2% | 0.01 μm or 0.2% | 0.02 μm or 0.4% |
| Precision3 | 0.001 μm | 0.001 μm | 0.002 μm |
| Stability4 | 0.001 μm | 0.001 μm | 0.002 μm |
| Spot Size | 100 μm | 100 μm | 100 μm |
| Measurement Speed | < 1s（Single Measurement), 10ms for F1 algorithm | < 1s（Single Measurement), 10ms for F1 algorithm | < 1s（Single Measurement), 10ms for F1 algorithm |
| Light Source | Halogen + Deuterium Lamp | Halogen Lamp | Halogen Lamp |
| Sample Size | Diameter from 1mm to 300mm or larger | Diameter from 1mm to 300mm or larger | Diameter from 1mm to 300mm or larger |
1.Depends on the specific material
2.Si/SiO2 (500~1000nm) standard film sample
3.Calculate the 1x standard deviation of 100 measurements of a 500nm SiO2 standard wafer, and take the average of the 1x standard deviations over 20 valid measurement days
4.Calculate the average of 100 measurements of a 500nm SiO2 standard wafer, and calculate the 2x standard deviation of the average values over 20 valid measurement days
NS-Touch Measurement Example，AR coating on Glass
NS-Touch static repeatability example
Hard coating on glass 1-sigma standard deviation is less than 0.001 microns。
