AcuiTik Film Measurements

Nanoscale Thickness Precision Measurement

A wide range of thickness measurement equipment products

It is our constant pursuit to provide services that exceed expectations and are of high quality.

Advance Algorithm

Precision film thickness repeatability and multi-layer film thickness

In-line Film Thickness Measurement Solution

Film Thickness in Semiconductor

AcuiTik Film Thickness Measurement Expert

Accuracy & High Quality

Professional R&D Team

10-year film thickness measurement equipments development experience

Super high stability

Accurate measurement, hitting the bullseye

High-efficiency algorithm

Robust algorithms empower a variety of application scenarios

Proactive service support

Good equipment requires even better after-sales service

Optical Thin Film Metrology

Film Thickness Measurement Expert

The normal incident reflection film thickness measurement method is simple in principle and easy to operate. It can measure the thickness of single or multiple layers in the range of one nanometer to one millimeter.

About AcuiTik Technology

AcuiTik was established by multiple Ph.D.s and master’s degree holders from top universities such as Berkeley, Fudan University, Shanghai Jiao Tong University, and ShanghaiTech University. The team has been dedicated to the fields of semiconductor equipment, smart manufacturing, and precision measurement technologies for years, accumulating extensive research and industrial experience.

Your measurement needs, just one click away—simple, instant, and precise.

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