Optical constants (n, k) of ZBLAN, covering 0.36 – 2.18 μm wavelength range.
| Wavelength (μm) | n | k |
|---|---|---|
| 0.3650 | 1.51770 | 0.00000 |
| 0.3963 | 1.51352 | 0.00000 |
| 0.4277 | 1.51026 | 0.00000 |
| 0.4590 | 1.50767 | 0.00000 |
| 0.4904 | 1.50557 | 0.00000 |
| 0.5217 | 1.50384 | 0.00000 |
| 0.5531 | 1.50240 | 0.00000 |
| 0.5845 | 1.50118 | 0.00000 |
| 0.6158 | 1.50014 | 0.00000 |
| 0.6471 | 1.49924 | 0.00000 |
| 0.6785 | 1.49846 | 0.00000 |
| 0.7098 | 1.49777 | 0.00000 |
| 0.7412 | 1.49717 | 0.00000 |
| 0.7725 | 1.49662 | 0.00000 |
| 0.8039 | 1.49613 | 0.00000 |
| 0.8353 | 1.49569 | 0.00000 |
| 0.8666 | 1.49529 | 0.00000 |
| 0.8979 | 1.49492 | 0.00000 |
| 0.9293 | 1.49458 | 0.00000 |
| 0.9607 | 1.49426 | 0.00000 |
| 0.9920 | 1.49397 | 0.00000 |
| 1.0233 | 1.49369 | 0.00000 |
| 1.0547 | 1.49343 | 0.00000 |
| 1.0860 | 1.49318 | 0.00000 |
| 1.1174 | 1.49295 | 0.00000 |
| 1.1487 | 1.49273 | 0.00000 |
| 1.1801 | 1.49251 | 0.00000 |
| 1.2114 | 1.49230 | 0.00000 |
| 1.2428 | 1.49210 | 0.00000 |
| 1.2741 | 1.49191 | 0.00000 |
| 1.3055 | 1.49172 | 0.00000 |
| 1.3368 | 1.49154 | 0.00000 |
| 1.3682 | 1.49136 | 0.00000 |
| 1.3996 | 1.49118 | 0.00000 |
| 1.4309 | 1.49100 | 0.00000 |
| 1.4622 | 1.49083 | 0.00000 |
| 1.4936 | 1.49066 | 0.00000 |
| 1.5249 | 1.49050 | 0.00000 |
| 1.5563 | 1.49033 | 0.00000 |
| 1.5876 | 1.49016 | 0.00000 |
| 1.6190 | 1.49000 | 0.00000 |
| 1.6503 | 1.48983 | 0.00000 |
| 1.6817 | 1.48967 | 0.00000 |
| 1.7130 | 1.48951 | 0.00000 |
| 1.7444 | 1.48934 | 0.00000 |
| 1.7757 | 1.48918 | 0.00000 |
| 1.8071 | 1.48902 | 0.00000 |
| 1.8384 | 1.48885 | 0.00000 |
| 1.8698 | 1.48869 | 0.00000 |
| 1.9011 | 1.48852 | 0.00000 |
| 1.9325 | 1.48835 | 0.00000 |
| 1.9638 | 1.48818 | 0.00000 |
| 1.9952 | 1.48802 | 0.00000 |
| 2.0266 | 1.48785 | 0.00000 |
| 2.0579 | 1.48767 | 0.00000 |
| 2.0892 | 1.48750 | 0.00000 |
| 2.1206 | 1.48733 | 0.00000 |
| 2.1520 | 1.48715 | 0.00000 |
| 2.1833 | 1.48698 | 0.00000 |
Sampled data (59 points total). Click "Download Full CSV" for complete data.
Acuitik film thickness measurement systems offer sub-nanometer non-contact precision.