Optical constants (n, k) of YVO4 (o), covering 0.49 – 2.17 μm wavelength range.
| Wavelength (μm) | n | k |
|---|---|---|
| 0.4880 | 2.02942 | 0.00000 |
| 0.5170 | 2.01887 | 0.00000 |
| 0.5460 | 2.01014 | 0.00000 |
| 0.5751 | 2.00282 | 0.00000 |
| 0.6041 | 1.99663 | 0.00000 |
| 0.6331 | 1.99133 | 0.00000 |
| 0.6621 | 1.98676 | 0.00000 |
| 0.6911 | 1.98280 | 0.00000 |
| 0.7202 | 1.97933 | 0.00000 |
| 0.7492 | 1.97628 | 0.00000 |
| 0.7782 | 1.97358 | 0.00000 |
| 0.8072 | 1.97118 | 0.00000 |
| 0.8362 | 1.96904 | 0.00000 |
| 0.8653 | 1.96712 | 0.00000 |
| 0.8943 | 1.96538 | 0.00000 |
| 0.9233 | 1.96382 | 0.00000 |
| 0.9523 | 1.96240 | 0.00000 |
| 0.9813 | 1.96111 | 0.00000 |
| 1.0104 | 1.95993 | 0.00000 |
| 1.0394 | 1.95885 | 0.00000 |
| 1.0684 | 1.95786 | 0.00000 |
| 1.0974 | 1.95695 | 0.00000 |
| 1.1264 | 1.95611 | 0.00000 |
| 1.1555 | 1.95534 | 0.00000 |
| 1.1845 | 1.95462 | 0.00000 |
| 1.2135 | 1.95396 | 0.00000 |
| 1.2425 | 1.95334 | 0.00000 |
| 1.2715 | 1.95276 | 0.00000 |
| 1.3006 | 1.95222 | 0.00000 |
| 1.3296 | 1.95172 | 0.00000 |
| 1.3586 | 1.95125 | 0.00000 |
| 1.3876 | 1.95081 | 0.00000 |
| 1.4166 | 1.95040 | 0.00000 |
| 1.4457 | 1.95001 | 0.00000 |
| 1.4747 | 1.94965 | 0.00000 |
| 1.5037 | 1.94930 | 0.00000 |
| 1.5327 | 1.94898 | 0.00000 |
| 1.5617 | 1.94867 | 0.00000 |
| 1.5908 | 1.94839 | 0.00000 |
| 1.6198 | 1.94811 | 0.00000 |
| 1.6488 | 1.94785 | 0.00000 |
| 1.6778 | 1.94761 | 0.00000 |
| 1.7068 | 1.94737 | 0.00000 |
| 1.7359 | 1.94715 | 0.00000 |
| 1.7649 | 1.94694 | 0.00000 |
| 1.7939 | 1.94674 | 0.00000 |
| 1.8229 | 1.94655 | 0.00000 |
| 1.8519 | 1.94637 | 0.00000 |
| 1.8810 | 1.94620 | 0.00000 |
| 1.9100 | 1.94603 | 0.00000 |
| 1.9390 | 1.94587 | 0.00000 |
| 1.9680 | 1.94572 | 0.00000 |
| 1.9970 | 1.94558 | 0.00000 |
| 2.0261 | 1.94544 | 0.00000 |
| 2.0551 | 1.94531 | 0.00000 |
| 2.0841 | 1.94518 | 0.00000 |
| 2.1131 | 1.94506 | 0.00000 |
| 2.1421 | 1.94494 | 0.00000 |
| 2.1712 | 1.94483 | 0.00000 |
Sampled data (59 points total). Click "Download Full CSV" for complete data.
Acuitik film thickness measurement systems offer sub-nanometer non-contact precision.