WS2 Refractive Index

Name: WS2 Refractive Index (n, k)
Creator: Acuitik
License: https://creativecommons.org/licenses/by/4.0/
Keywords: WS2, refractive index, n, k, optical constants, thin film

Optical constants (n, k) of WS2, covering 0.36 – 1.70 μm wavelength range.

Range 0.365 – 1.700 μm

Data Points 1336

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)

n = 3.9630

k = 0.2717

589.3 nm (Na-D)

n = 2.5850

k = 0.5560

532 nm

n = 4.0120

k = 0.5058

1550 nm (Telecom)

n = 2.7450

k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)	n	k
0.3650	2.40200	2.77500
0.3980	3.17000	2.74000
0.4310	4.09200	2.41900
0.4640	4.13300	1.05100
0.4970	3.63700	0.96680
0.5300	4.03500	0.57000
0.5630	3.32100	0.12810
0.5960	2.46700	1.09500
0.6290	4.05800	0.35520
0.6620	3.55900	0.07378
0.6950	3.35200	0.03149
0.7280	3.23000	0.01761
0.7610	3.14600	0.01129
0.7940	3.08300	0.00786
0.8270	3.03400	0.00577
0.8600	2.99500	0.00439
0.8930	2.96200	0.00343
0.9260	2.93400	0.00273
0.9590	2.91100	0.00220
0.9920	2.89100	0.00179
1.0250	2.87300	0.00147
1.0580	2.85700	0.00122
1.0910	2.84300	0.00101
1.1240	2.83100	0.00083
1.1570	2.82000	0.00069
1.1900	2.81000	0.00057
1.2230	2.80100	0.00047
1.2560	2.79300	0.00038
1.2890	2.78600	0.00031
1.3220	2.77900	0.00025
1.3550	2.77300	0.00020
1.3880	2.76700	0.00015
1.4210	2.76200	0.00012
1.4540	2.75700	0.00009
1.4870	2.75300	0.00006
1.5200	2.74800	0.00004
1.5530	2.74500	0.00003
1.5860	2.74100	0.00002
1.6190	2.73800	0.00001
1.6520	2.73400	0.00000
1.6850	2.73200	0.00000
1.7000	2.73000	0.00000

Sampled data (1336 points total). Click "Download Full CSV" for complete data.

Notes

Optical constants of monolayer WS₂ were measured by spectroscopic ellipsometry in the spectral range 365–1700 nm. WS₂ samples were grown on sapphire by atmospheric pressure chemical vapor deposition and then transferred on silicon wafers covered by 295 nm SiO₂. Tauc–Lorentz oscillators were used in ellipsometry model to describe the optical response of excitons.

References

G. A. Ermolaev, D. I. Yakubovsky, Yu. V. Stebunov, A. V. Arsenin, V. S. Volkov. Spectral ellipsometry of monolayer transition metal dichalcogenides: Analysis of excitonic peaks in dispersion. J. Vac. Sci. Technol. B 38, 014002 (2020) (Numerical data kindly provided by Georgy Ermolaev)

Related Materials (Main)

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

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