Te Refractive Index

Optical constants (n, k) of Te, covering 0.20 – 2.00 μm wavelength range.

Range 0.200 – 2.000 μm
Data Points 278

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 4.2550
k = 2.4340
589.3 nm (Na-D)
n = 3.9070
k = 2.7230
532 nm
n = 3.2410
k = 2.8780
1550 nm (Telecom)
n = 4.5790
k = 0.1610

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.20001.519001.08900
0.20391.491001.08800
0.20811.463001.09300
0.21231.436001.10600
0.21681.410001.12400
0.22141.388001.14800
0.22631.368001.17500
0.23131.351001.20500
0.23661.334001.23700
0.24221.318001.27300
0.24801.301001.31300
0.25411.283001.36200
0.26051.268001.42000
0.26721.259001.48800
0.27431.258001.56600
0.28181.270001.65000
0.28971.295001.73800
0.29811.332001.82500
0.30691.380001.90900
0.31631.435001.99100
0.32631.496002.07100
0.33701.564002.15300
0.34831.642002.23600
0.36051.731002.32000
0.37351.833002.40100
0.38751.947002.47900
0.40262.072002.55400
0.41892.212002.62600
0.43662.369002.69200
0.45592.543002.74600
0.47692.729002.79300
0.50002.937002.83900
0.52543.192002.87600
0.55363.506002.86200
0.58493.850002.75200
0.62004.166002.53000
0.65964.394002.22200
0.70464.501001.88800
0.75614.497001.59800
0.81584.434001.40900
0.88574.406001.33000
0.96884.498001.28400
1.06904.690001.12500
1.19234.819000.79800
1.34784.766000.43100
1.63164.504000.10000
1.93754.284000.00500
2.00004.252000.00200

Sampled data (278 points total). Click "Download Full CSV" for complete data.

Notes

30 nm-thick tellurium film deposited directly on SiO2 substrate

References

A. Ciesielski, L. Skowronski, W.Pacuski, T. Szoplik. Permittivity of Ge, Te and Se thin films in the 200–1500 nm spectral range. Predicting the segregation effects in silver. Mat. Sci. Semicond. Process. 81, 64-67 (2018) (Numerical data kindly provided by Arkadiusz Ciesielski)

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