SiC Refractive Index

Optical constants (n, k) of SiC, covering 0.01 – 2.09 μm wavelength range.

Range 0.006 – 2.092 μm
Data Points 445

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 3.3901
k = 0.2738
589.3 nm (Na-D)
n = 3.4116
k = 0.3214
532 nm
n = 3.4404
k = 0.3951

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.00620.990670.00700
0.00660.989690.00857
0.00720.988510.01127
0.00780.989910.01267
0.00840.989650.01427
0.00910.988850.01584
0.00980.991370.01827
0.01060.994890.01815
0.01140.995000.01454
0.01231.001350.01278
0.01330.985630.00432
0.01440.978440.00517
0.01560.971350.00647
0.01680.964120.00864
0.01820.956680.01089
0.01960.948230.01317
0.02120.938260.01566
0.02290.926370.01877
0.02470.912260.02304
0.02670.895970.02850
0.02890.876680.03586
0.03120.855010.04566
0.03370.830250.05703
0.03640.800730.07139
0.03930.766310.08987
0.04610.674150.14330
0.06460.422460.57000
0.09760.587151.46000
0.16481.886832.25165
0.22652.998661.96246
0.29423.517201.31546
0.36193.591930.84321
0.42973.496910.59870
0.49743.459730.45685
0.56513.424130.35185
0.63283.390100.27380
0.70053.357570.21887
0.76833.330820.17675
0.83603.305440.14636
0.90373.284540.12495
1.31103.209190.05154
2.09203.146220.01265

Sampled data (445 points total). Click "Download Full CSV" for complete data.

Notes

Density: 2.98 g/cm3. Film deposited at room temperature.

References

J. I. Larruquert, A. P. Pérez-Marín, S. García-Cortés, L. Rodríguez-de Marcos, J. A. Aznárez, J. A. Méndez. Self-consistent optical constants of SiC thin films. J. Opt. Soc. Am. A 28, 2340-2345 (2011) (Numerical data kindly provided by Juan Larruquert)

Related Materials (Main)

Need to measure SiC thin film thickness?

Acuitik film thickness measurement systems offer sub-nanometer non-contact precision.