Se Refractive Index

Optical constants (n, k) of Se, covering 0.20 – 2.00 μm wavelength range.

Range 0.200 – 2.000 μm
Data Points 278

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 1.4290
k = 0.0095
589.3 nm (Na-D)
n = 1.4588
k = 0.0378
532 nm
n = 1.4755
k = 0.1088
1550 nm (Telecom)
n = 1.3304
k = 0.0001

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.20001.143000.31060
0.20391.140800.30240
0.20811.141800.29460
0.21231.144500.28670
0.21681.144900.28210
0.22141.144700.28150
0.22631.145600.28480
0.23131.149600.29100
0.23661.157700.29830
0.24221.169800.30440
0.24801.184700.30750
0.25411.200300.30680
0.26051.214700.30270
0.26721.226400.29660
0.27431.235100.29040
0.28181.241500.28600
0.28971.247400.28410
0.29811.254500.28440
0.30691.263700.28590
0.31631.275400.28720
0.32631.288900.28750
0.33701.303800.28650
0.34831.319900.28420
0.36051.337400.28050
0.37351.356500.27460
0.38751.376700.26540
0.40261.396800.25220
0.41891.415400.23530
0.43661.431300.21560
0.45591.444800.19410
0.47691.456600.17120
0.50001.467300.14540
0.52541.474900.11450
0.55361.474600.07870
0.58491.462100.04310
0.62001.438300.01570
0.65961.410300.00210
0.70461.389000.00040
0.75611.374900.00020
0.81581.364100.00010
0.88571.355600.00010
0.96881.348600.00010
1.06901.342700.00010
1.19231.337900.00010
1.34781.333800.00010
1.63161.329400.00010
1.93751.326800.00010
2.00001.326400.00010

Sampled data (278 points total). Click "Download Full CSV" for complete data.

Notes

25 nm-thick selenium film deposited directly on SiO2 substrate

References

A. Ciesielski, L. Skowronski, W.Pacuski, T. Szoplik. Permittivity of Ge, Te and Se thin films in the 200–1500 nm spectral range. Predicting the segregation effects in silver. Mat. Sci. Semicond. Process. 81, 64-67 (2018) (Numerical data kindly provided by Arkadiusz Ciesielski)

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