Sc2O3 Refractive Index

Optical constants (n, k) of Sc2O3, covering 0.23 – 1.20 μm wavelength range.

Range 0.230 – 1.200 μm
Data Points 486

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 1.9933
k = 0.0000
589.3 nm (Na-D)
n = 1.9981
k = 0.0000
532 nm
n = 2.0071
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.23002.350000.00566
0.25402.260010.00387
0.27802.191500.00264
0.30202.144010.00181
0.32602.109900.00124
0.35002.084650.00085
0.37402.065470.00058
0.39802.050580.00040
0.42202.038790.00027
0.44602.029310.00018
0.47002.021570.00013
0.49402.015160.00009
0.51802.009810.00006
0.54202.005280.00004
0.56602.001420.00003
0.59001.998100.00002
0.61401.995220.00001
0.63801.992710.00001
0.66201.990510.00001
0.68601.988560.00000
0.71001.986830.00000
0.73401.985300.00000
0.75801.983920.00000
0.78201.982680.00000
0.80601.981560.00000
0.83001.980550.00000
0.85401.979620.00000
0.87801.978780.00000
0.90201.978020.00000
0.92601.977310.00000
0.95001.976660.00000
0.97401.976070.00000
0.99801.975520.00000
1.02201.975010.00000
1.04601.974530.00000
1.07001.974090.00000
1.09401.973690.00000
1.11801.973300.00000
1.14201.972950.00000
1.16601.972620.00000
1.19001.972300.00000
1.20001.972180.00000

Sampled data (486 points total). Click "Download Full CSV" for complete data.

Notes

Stoichiometric 270±5 nm film on SiO2 substrate.

References

A. Belosludtsev, K. Juškevičius, L. Ceizaris, R. Samuilovas, S. Stanionytė, V. Jasulaitienė, S. Kičas. Correlation between stoichiometry and properties of scandium oxide films prepared by reactive magnetron sputtering. Appl. Surf. Sci. 427, 312-318 (2018) (Numerical data kindly provided by Alexandr Belosludtsev)

Related Materials (Main)

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

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