Nb2O5 Refractive Index

Optical constants (n, k) of Nb2O5, covering 0.12 – 2.20 μm wavelength range.

Range 0.120 – 2.200 μm
Data Points 1264

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 2.3259
k = 0.0000
589.3 nm (Na-D)
n = 2.3430
k = 0.0000
532 nm
n = 2.3737
k = 0.0000
1550 nm (Telecom)
n = 2.2357
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.12011.215971.25117
0.12891.446231.33517
0.13851.649061.28226
0.14871.785271.16806
0.15971.763571.10072
0.17151.773771.15331
0.18421.852871.23489
0.19791.987691.30287
0.21252.157411.34661
0.22822.370841.36893
0.24512.651711.32755
0.26322.957741.13897
0.28273.151900.78877
0.30363.138030.40695
0.32612.969050.13389
0.35022.760070.02122
0.37622.621240.00082
0.40402.534500.00000
0.43392.475460.00000
0.46602.431560.00000
0.50052.397550.00000
0.53752.370490.00000
0.57732.348560.00000
0.62002.330520.00000
0.66582.315510.00000
0.71512.302900.00000
0.76802.292190.00000
0.82482.283030.00000
0.88592.275110.00000
0.95142.268210.00001
1.02182.262120.00001
1.09742.256690.00001
1.17862.251780.00001
1.26582.247250.00001
1.35952.243020.00002
1.46012.238970.00002
1.56812.235020.00003
1.68412.231070.00003
1.80872.227040.00004
1.94252.222850.00005
2.08632.218390.00006
2.19972.214850.00008

Sampled data (1264 points total). Click "Download Full CSV" for complete data.

Notes

Nb2O5; Deposited by magnetron sputtering; Heterogenous data processing combining ellipsometric and spectrophotometric measurements of five samples with thicknesses between 20 and 250 nm; Room temperature.

References

D. Franta, B. Hroncová, J. Dvořák, J. Vohánka, P Franta, I. Ohlídal, V. Pekař, D. Škoda. Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model. Opt. Mat., 157, 116133 (2024) (Numerical data kindly provided by Jan Dvořák)

Related Materials (Main)

Need to measure Nb2O5 thin film thickness?

Acuitik film thickness measurement systems offer sub-nanometer non-contact precision.