MgF2 Refractive Index

Optical constants (n, k) of MgF2, covering 0.03 – 2.20 μm wavelength range.

Range 0.028 – 2.200 μm
Data Points 1904

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 1.3820
k = 0.0000
589.3 nm (Na-D)
n = 1.3828
k = 0.0000
532 nm
n = 1.3842
k = 0.0000
1550 nm (Telecom)
n = 1.3746
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.02750.877030.08230
0.03060.870260.11746
0.03420.886230.15395
0.03810.856390.15450
0.04240.846460.20579
0.04720.762290.23655
0.05270.673850.52427
0.05870.945120.75023
0.06541.251460.72643
0.07281.364340.61897
0.08121.433490.52654
0.09041.489870.48864
0.10081.368420.64782
0.11231.896000.03456
0.12511.627540.00401
0.13941.538660.00038
0.15541.490930.00003
0.17311.461020.00000
0.19291.440630.00000
0.21501.426020.00000
0.23961.415240.00000
0.26691.407090.00000
0.29741.400840.00000
0.33141.395990.00000
0.36931.392180.00000
0.41151.389170.00000
0.45861.386770.00000
0.51101.384830.00000
0.56941.383260.00000
0.63451.381960.00000
0.70701.380870.00000
0.78781.379940.00000
0.87781.379100.00000
0.97811.378330.00000
1.08991.377580.00000
1.21451.376810.00000
1.35331.375960.00000
1.50801.374940.00000
1.68041.373310.00034
1.87241.373330.00213
2.08641.373180.00047
2.19991.372060.00009

Sampled data (1904 points total). Click "Download Full CSV" for complete data.

Notes

Film MgF2; Deposited by e-beam evaporation on c-Si; 134.2 nm thick film with an polycrystalline structure; Heterogenous data processing combining ellipsometric and spectrophotometric measurements; Room temperature.

References

D. Franta, D. Nečas, A. Giglia, P. Franta, I. Ohlídal. Universal dispersion model for characterization of optical thin films over wide spectral range: Application to magnesium fluoride. Appl. Surf. Sci. 421, 424–429 (2017) (Numerical data kindly provided by Daniel Franta)

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