MgF2 (e) Refractive Index

Optical constants (n, k) of MgF2 (e), covering 0.14 – 2.18 μm wavelength range.

Range 0.140 – 2.183 μm
Data Points 70

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 1.3887
k = 0.0000
589.3 nm (Na-D)
n = 1.3895
k = 0.0000
532 nm
n = 1.3905
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.14001.518590.00000
0.14571.503670.00000
0.15161.490870.00000
0.15781.479790.00000
0.16421.470150.00000
0.17081.461690.00000
0.17781.454240.00000
0.18501.447650.00000
0.19251.441790.00000
0.20031.436570.00000
0.20851.431890.00000
0.21691.427690.00000
0.22571.423920.00000
0.23491.420510.00000
0.24441.417430.00000
0.25441.414640.00000
0.26471.412110.00000
0.27551.409810.00000
0.28661.407720.00000
0.29831.405810.00000
0.31041.404070.00000
0.32301.402480.00000
0.33611.401030.00000
0.34981.399700.00000
0.36401.398480.00000
0.37881.397360.00000
0.39411.396330.00000
0.41011.395380.00000
0.42681.394510.00000
0.44411.393710.00000
0.46221.392970.00000
0.48091.392280.00000
0.50051.391650.00000
0.52081.391060.00000
0.54201.390520.00000
0.56401.390010.00000
0.58691.389540.00000
0.61071.389100.00000
0.63551.388690.00000
0.66131.388310.00000
0.68821.387950.00000
0.71611.387600.00000
0.74521.387280.00000
0.77551.386970.00000
0.80701.386680.00000
0.83971.386400.00000
0.87391.386120.00000
0.90931.385860.00000
0.94631.385600.00000
0.98471.385350.00000
1.02471.385100.00000
1.06631.384850.00000
1.10961.384600.00000
1.15471.384360.00000
1.20161.384100.00000
1.25041.383840.00000
1.30121.383580.00000
1.35401.383310.00000
1.40901.383020.00000
1.46621.382730.00000
1.52581.382420.00000
1.58771.382090.00000
1.65221.381750.00000
1.71931.381390.00000
1.78911.381000.00000
1.86181.380590.00000
1.93741.380150.00000
2.01611.379680.00000
2.09801.379180.00000
2.18321.378640.00000

Sampled data (70 points total). Click "Download Full CSV" for complete data.

Notes

293 K (20 °C). Extraordinary ray (e).

References

H. H. Li. Refractive index of alkaline earth halides and its wavelength and temperature derivatives. J. Phys. Chem. Ref. Data 9, 161-289 (1980) and references therein.
* Sellmeier formula is derived by critical analysis of experimental data from several sources.

Related Materials (Main)

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

Need to measure MgF2 (e) thin film thickness?

Acuitik film thickness measurement systems offer sub-nanometer non-contact precision.

View ProductsContact Us