HfSe2 (e) Refractive Index

Optical constants (n, k) of HfSe2 (e), covering 0.36 – 1.00 μm wavelength range.

Range 0.360 – 1.000 μm
Data Points 402

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 3.9366
k = 0.0000
589.3 nm (Na-D)
n = 3.9522
k = 0.0000
532 nm
n = 3.9787
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.36004.150120.00000
0.37604.123790.00000
0.39204.100610.00000
0.40804.080110.00000
0.42404.061890.00000
0.44004.045620.00000
0.45604.031030.00000
0.47204.017900.00000
0.48804.006040.00000
0.50403.995290.00000
0.52003.985510.00000
0.53443.977460.00000
0.55043.969240.00000
0.56643.961710.00000
0.58243.954790.00000
0.59843.948410.00000
0.61443.942530.00000
0.63043.937090.00000
0.64643.932050.00000
0.66243.927370.00000
0.67843.923020.00000
0.69443.918960.00000
0.71043.915180.00000
0.72643.911640.00000
0.74243.908330.00000
0.75843.905230.00000
0.77443.902320.00000
0.79043.899580.00000
0.80643.897000.00000
0.82243.894570.00000
0.83843.892280.00000
0.85443.890120.00000
0.87043.888080.00000
0.88643.886140.00000
0.90243.884310.00000
0.91843.882570.00000
0.93443.880920.00000
0.95043.879360.00000
0.96643.877870.00000
0.98243.876450.00000
0.99843.875100.00000
1.00003.874970.00000

Sampled data (402 points total). Click "Download Full CSV" for complete data.

Notes

Multilayer crystals. Out-of-plane (extraordinary ray, e). Room temperature.

References

P. G. Zotev, Y. Wang, D. Andres-Penares, T. Severs-Millard, S. Randerson, X. Hu, L. Sortino, C. Louca, M. Brotons-Gisbert, T. Huq, S. Vezzoli, R. Sapienza, T. F. Krauss, B. D. Gerardot, A. I. Tartakovskii. Van der Waals materials for applications in nanophotonics. Laser and Photonics Rev. 17, 2200957 (2023) (Numerical data kindly provided by Panaiot Zotev)

Related Materials (Main)

Need to measure HfSe2 (e) thin film thickness?

Acuitik film thickness measurement systems offer sub-nanometer non-contact precision.