GdF3 Refractive Index

Optical constants (n, k) of GdF3, covering 0.12 – 2.20 μm wavelength range.

Range 0.120 – 2.200 μm
Data Points 10107

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 1.5841
k = 0.0000
589.3 nm (Na-D)
n = 1.5854
k = 0.0000
532 nm
n = 1.5878
k = 0.0000
1550 nm (Telecom)
n = 1.5747
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.12002.239900.09982
0.12902.013880.00078
0.13871.886550.00000
0.14911.813680.00000
0.16041.764100.00000
0.17241.728000.00000
0.18541.700600.00000
0.19931.679220.00000
0.21431.662180.00000
0.23051.648410.00000
0.24781.637140.00000
0.26641.627820.00000
0.28651.620070.00000
0.30801.613570.00000
0.33121.608100.00000
0.35611.603480.00000
0.38291.599550.00000
0.41171.596200.00000
0.44271.593330.00000
0.47601.590880.00000
0.51181.588760.00000
0.55031.586940.00000
0.59171.585360.00000
0.63621.583980.00000
0.68411.582780.00000
0.73551.581730.00000
0.79081.580790.00000
0.85031.579960.00001
0.91431.579200.00001
0.98311.578510.00001
1.05701.577870.00001
1.13651.577260.00001
1.22211.576670.00002
1.31401.576100.00002
1.41281.575520.00003
1.51911.574920.00003
1.63341.574290.00004
1.75631.573630.00005
1.88841.572900.00007
2.03041.572110.00008
2.18321.571220.00010
2.19961.571130.00010

Sampled data (10107 points total). Click "Download Full CSV" for complete data.

Notes

Films GdF3; Deposited by thermal evaporation on c-Si; Five samples with a polycrystalline structure and nominal thicknesses 20–600 nm; Multi-sample method; Heterogenous data processing combining ellipsometric and spectrophotometric measurements; Inhomogeneous layers; Optical constants correspond to the thinest film; Room temperature.

References

D. Franta, J. Vohánka, J. Dvořák, P. Franta, I. Ohlídal, P. Klapetek, J. Březina, D. Škoda. Optical characterization of gadolinium fluoride films using universal dispersion model. Coatings 13, 218 (2023) (Numerical data kindly provided by Daniel Franta)

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