EuS Refractive Index

Optical constants (n, k) of EuS, covering 0.19 – 1.70 μm wavelength range.

Range 0.190 – 1.700 μm
Data Points 1091

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 2.1410
k = 0.0430
589.3 nm (Na-D)
n = 2.1560
k = 0.0700
532 nm
n = 2.1520
k = 0.1150
1550 nm (Telecom)
n = 2.0470
k = 0.0040

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.19001.984001.06300
0.21702.294000.88200
0.24402.394000.66600
0.27102.608000.49800
0.29802.476000.22200
0.32502.346000.12900
0.35202.262000.09900
0.37902.204000.08500
0.40602.159000.08300
0.43302.126000.09500
0.46002.115000.11600
0.48702.125000.12900
0.51402.142000.12500
0.54102.155000.10900
0.56802.159000.08700
0.59502.155000.06600
0.62202.145000.04800
0.64902.134000.03600
0.67602.122000.02800
0.70302.111000.02300
0.73002.102000.02000
0.75702.095000.01900
0.78402.089000.01800
0.81102.084000.01800
0.83802.080000.01800
0.86502.077000.01800
0.89202.074000.01700
0.91902.072000.01700
0.94602.070000.01600
0.97302.068000.01600
1.00002.067000.01500
1.06752.063000.01300
1.13502.060000.01100
1.20252.058000.00900
1.27002.055000.00800
1.33752.053000.00700
1.40502.051000.00600
1.47252.049000.00500
1.54002.047000.00400
1.60752.046000.00300
1.67502.044000.00300
1.70002.044000.00300

Sampled data (1091 points total). Click "Download Full CSV" for complete data.

Notes

Ellipsometry sample: 100 nm thin film of electron beam evaporated EuS deposited on a 0.5 mm thick Si substrate held at room temperature. The base vacuum of the system was ~6×10-8 Torr whereas during electron-beam evaporation of EuS it was at ~2×10-6 Torr.

References

M. L. Meretska, F. H. B. Somhorst, M. Ossiander, Y. Hou, J. Moodera, F. Capasso. Measurements of the magneto-optical properties of thin-film EuS at room temperature in the visible spectrum. Appl. Phys. Lett. 120, 251103 (2022) (Numerical data kindly provided by Frank Somhorst)

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