CdTe Refractive Index

Optical constants (n, k) of CdTe, covering 0.30 – 1.50 μm wavelength range.

Range 0.301 – 1.498 μm
Data Points 583

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 2.9485
k = 0.2794
589.3 nm (Na-D)
n = 2.9585
k = 0.3185
532 nm
n = 2.9801
k = 0.3857

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.30142.472731.89384
0.32382.913661.72454
0.34613.147831.44281
0.36853.311641.20072
0.39083.404970.85103
0.41323.257910.57175
0.43563.108210.49631
0.45793.041700.47295
0.48033.011060.44876
0.50272.994000.42186
0.52502.982780.39376
0.54742.973830.36569
0.56972.965410.33905
0.59212.957420.31527
0.61442.951200.29490
0.63672.948400.27685
0.65912.949580.25868
0.68142.953540.23797
0.70372.957970.21353
0.72592.960520.18566
0.74822.959730.15562
0.77052.955290.12493
0.79272.948890.09432
0.81502.940240.05441
0.83722.903010.01728
0.85942.867040.00886
0.88152.842970.00597
0.90372.824050.00397
0.92582.808240.00260
0.94792.794700.00168
0.97002.782930.00108
0.99212.772590.00068
1.03902.754190.00026
1.08692.739200.00009
1.13482.726920.00003
1.18272.716650.00001
1.23062.707920.00000
1.27852.700400.00000
1.32642.693840.00000
1.37442.688080.00000
1.42242.682970.00000
1.47052.678420.00000
1.49792.676020.00000

Sampled data (583 points total). Click "Download Full CSV" for complete data.

Notes

A CdTe film was deposited on to a soda-lime glass substrate using RF magnetron sputtering. A variable-angle ellipsometer was used to take amplitude and phase change measurements. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm

References

R. E. Treharne, A. Seymour-Pierce, K. Durose, K. Hutchings, S. Roncallo, D. Lane, Optical design and fabrication of fully sputtered CdTe/CdS solar cells. J. Phys: Conf. Ser. 286, 012038, (2011) (Numerical data kindly provided Dr. Robert Treharne)

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