AlN (o) Refractive Index

Optical constants (n, k) of AlN (o), covering 0.22 – 2.15 μm wavelength range.

Range 0.220 – 2.151 μm
Data Points 74

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 2.1493
k = 0.0000
589.3 nm (Na-D)
n = 2.1531
k = 0.0000
532 nm
n = 2.1626
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.22002.579370.00000
0.22702.520260.00000
0.23422.472270.00000
0.24162.432580.00000
0.24932.399250.00000
0.25722.370910.00000
0.26532.346560.00000
0.27382.325440.00000
0.28252.306980.00000
0.29142.290740.00000
0.30072.276360.00000
0.31022.263570.00000
0.32002.252130.00000
0.33022.241850.00000
0.34072.232600.00000
0.35152.224220.00000
0.36262.216620.00000
0.37412.209710.00000
0.38602.203410.00000
0.39832.197640.00000
0.41092.192360.00000
0.42392.187510.00000
0.43742.183050.00000
0.45132.178930.00000
0.46562.175140.00000
0.48042.171630.00000
0.49562.168370.00000
0.51132.165360.00000
0.52752.162560.00000
0.54432.159950.00000
0.56152.157530.00000
0.57942.155260.00000
0.59772.153150.00000
0.61672.151170.00000
0.63632.149320.00000
0.65652.147580.00000
0.67732.145950.00000
0.69882.144410.00000
0.72102.142960.00000
0.74382.141590.00000
0.76742.140300.00000
0.79182.139070.00000
0.81692.137900.00000
0.84282.136790.00000
0.86962.135730.00000
0.89722.134710.00000
0.92562.133730.00000
0.95502.132790.00000
0.98532.131880.00000
1.01662.131000.00000
1.04882.130140.00000
1.08212.129300.00000
1.11642.128470.00000
1.15182.127660.00000
1.18842.126860.00000
1.22612.126060.00000
1.26502.125270.00000
1.30512.124470.00000
1.34652.123670.00000
1.38932.122870.00000
1.43332.122050.00000
1.47882.121210.00000
1.52572.120360.00000
1.57422.119490.00000
1.62412.118590.00000
1.67562.117660.00000
1.72882.116700.00000
1.78362.115710.00000
1.84022.114670.00000
1.89862.113580.00000
1.95892.112450.00000
2.02102.111260.00000
2.08512.110000.00000
2.15132.108690.00000

Sampled data (74 points total). Click "Download Full CSV" for complete data.

Notes

Ordinary ray (o).

References

J. Pastrňák and L. Roskovcová. Refraction index measurements on AlN single crystals. Phys. Stat. Sol. 14, K5-K8 (1966)

Related Materials (Main)

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

Need to measure AlN (o) thin film thickness?

Acuitik film thickness measurement systems offer sub-nanometer non-contact precision.

View ProductsContact Us