Al2O3 Refractive Index

Optical constants (n, k) of Al2O3, covering 0.11 – 2.20 μm wavelength range.

Range 0.114 – 2.200 μm
Data Points 258

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 1.6513
k = 0.0000
589.3 nm (Na-D)
n = 1.6535
k = 0.0000
532 nm
n = 1.6572
k = 0.0000
1550 nm (Telecom)
n = 1.6344
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.11411.716410.83032
0.12231.861000.75337
0.13101.975510.64118
0.14042.051500.50595
0.15042.084340.36124
0.16122.072990.22146
0.17272.020050.10250
0.18511.934720.02408
0.19831.854010.00562
0.21251.807470.00278
0.22771.775010.00144
0.24401.750770.00078
0.26141.731980.00044
0.28011.717040.00025
0.30021.704950.00015
0.32161.695020.00008
0.34461.686780.00004
0.36931.679880.00001
0.39571.674050.00000
0.42401.669110.00000
0.45431.664890.00000
0.48681.661280.00000
0.52161.658160.00000
0.55891.655450.00000
0.59891.653090.00000
0.64171.651020.00000
0.68761.649180.00000
0.73681.647550.00000
0.78951.646070.00000
0.84591.644720.00000
0.90641.643470.00000
0.97131.642300.00000
1.04071.641180.00000
1.11521.640080.00000
1.19491.638990.00000
1.28041.637880.00000
1.37201.636730.00000
1.47011.635520.00000
1.57521.634230.00000
1.68791.632820.00000
1.80861.631260.00000
1.93791.629530.00000
2.07651.627600.00000
2.19961.625790.00000

Sampled data (258 points total). Click "Download Full CSV" for complete data.

Notes

Film Al2O3;
Deposited by e-beam evaporation on c-Si; 121.5 nm thick film with an amorphous (very fine polycrystalline) structure;
Heterogenous data processing combining ellipsometric and spectrophotometric measurements;
Room temperature.

References

D. Franta, D. Nečas, I. Ohlídal, A. Giglia. Dispersion model for optical thin films applicable in wide spectral range. Proc. SPIE 9628, 96281U (2015) (Numerical data kindly provided by Daniel Franta)

Related Materials (Main)

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

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