AgGaS2 (o) Refractive Index

Optical constants (n, k) of AgGaS2 (o), covering 0.49 – 2.13 μm wavelength range.

Range 0.490 – 2.134 μm
Data Points 47

Optical Constants at Key Wavelengths

632.8 nm (He-Ne)
n = 2.5535
k = 0.0000
589.3 nm (Na-D)
n = 2.5804
k = 0.0000
532 nm
n = 2.6339
k = 0.0000
1550 nm (Telecom)
n = 2.4260
k = 0.0000

n, k Dispersion Curves

Data Table (Sampled)

Wavelength (μm)nk
0.49002.711440.00000
0.50592.682040.00000
0.52242.656390.00000
0.53932.633850.00000
0.55692.613930.00000
0.57502.596220.00000
0.59372.580410.00000
0.61292.566230.00000
0.63292.553460.00000
0.65342.541940.00000
0.67472.531490.00000
0.69662.522010.00000
0.71922.513370.00000
0.74262.505480.00000
0.76682.498270.00000
0.79172.491650.00000
0.81742.485580.00000
0.84402.480000.00000
0.87142.474860.00000
0.89972.470110.00000
0.92902.465730.00000
0.95912.461680.00000
0.99032.457930.00000
1.02252.454450.00000
1.05572.451220.00000
1.09002.448230.00000
1.12552.445440.00000
1.16202.442850.00000
1.19982.440430.00000
1.23882.438180.00000
1.27912.436080.00000
1.32062.434120.00000
1.36362.432280.00000
1.40792.430560.00000
1.45362.428950.00000
1.50092.427450.00000
1.54962.426030.00000
1.60002.424700.00000
1.65202.423440.00000
1.70572.422260.00000
1.76112.421150.00000
1.81842.420090.00000
1.87752.419090.00000
1.93852.418150.00000
2.00152.417250.00000
2.06652.416390.00000
2.13372.415570.00000

Sampled data (47 points total). Click "Download Full CSV" for complete data.

Notes

Ordinary ray (e)

References

1) G. D. Boyd, H. Kasper, J. H McFee. Linear and nonlinear optical properties of AgGaS2, CuGaS2, and CuInS2, and theory of the wedge technique for the measurement of nonlinear coefficients. IEEE J. Quantum Electron., 7, 563-573 (1971)
2) G. C. Bhar. Refractive index interpolation in phase-matching. Appl. Opt. 15, 305-307 (1976)
* Ref. 2 provides a dispersion formula based on data from Ref. 1

Related Materials (Main)

Ag Ag3AsS3 (e) Ag3AsS3 (o) AgBr AgCl AgGaS2 (e)

Need to measure AgGaS2 (o) thin film thickness?

Acuitik film thickness measurement systems offer sub-nanometer non-contact precision.

View ProductsContact Us