High-precision film thickness sensor supporting multi-point simultaneous measurement, suitable for real-time monitoring of complex thin film processes.
Providing high-precision, multi-point simultaneous measurement solutions for complex thin film processes
Compact structure, easy to integrate into various equipment
Can be installed horizontally, vertically, or inverted, all directions supported
Support multiple points measurement simultaneously, real-time full wafer film thickness distribution
Response time <100ms, supporting 7×24 hour continuous operation
High-precision real-time monitoring system for semiconductor-grade production environments
Multi-point nano film thickness sensors are widely used in semiconductor, photovoltaic, LED, MEMS and other manufacturing fields
Contact us for detailed information about multi-point nano film thickness sensors and get exclusive solutions