Dual-Channel Reflectance & Transmittance

NS-Vista Dual-Channel Film Thickness Meter

An advanced desktop thin film thickness measurement and analysis system. With simultaneous reflectance and transmittance measurement capabilities, measuring glass substrates and challenging samples is no longer difficult.

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Dual-Channel

Reflectance & Transmittance

0.2-1.5mm

Spot Size Range

Vista Learning

AI Algorithm

Key Features

NS-Vista integrates multiple innovative technologies from Acuitik to provide powerful solutions for complex sample measurement

Dual-Channel Measurement

Simultaneously measure reflectance and transmittance, both capable of calculating film thickness to meet diverse measurement needs.

Wide Spot Size Range

Spot size can be dynamically adjusted from 0.2mm to 1.5mm, adapting to different sample sizes and measurement requirements.

Vista Learning Algorithm

Intelligent algorithm specifically designed for measuring samples with very rough surfaces and extremely thick films.

High/Low Reflectance Samples

Powerful capability to measure both high-reflectance and low-reflectance samples with excellent accuracy.

Technical Specifications

Detailed technical parameters to help you fully understand NS-Vista's performance specifications

Measurement Performance

Measurement Channels Reflectance + Transmittance

Measurement Range 1nm - 1mm

Measurement Accuracy ±0.1nm

Spot Size Range 0.2mm - 1.5mm

Sample Applicability High/Low Reflectance

Sample Specifications

Max Sample Size 300mm × 300mm

Sample Thickness 0.1mm - 20mm

Transparent Sample Support Supported

Rough Surface Measurement Supported (Vista Learning)

Ultra-Thick Sample Supported (Vista Learning)

Software Features

Dual-channel data synchronous acquisition

Vista Learning intelligent algorithm

Reflectance & transmittance combined analysis

Glass substrate film thickness measurement

Data export and report generation

Equipment Configuration

Equipment Type Desktop

Power Requirement AC 220V / 50Hz

Operating Temperature 15°C - 30°C

Relative Humidity < 80%RH

Equipment Weight Approx. 15kg

Application Fields

NS-Vista, with its unique advantages, is widely used in various complex sample measurement scenarios

Glass Substrate Films

Optical coating and film thickness measurement on glass substrates, overcoming measurement difficulties caused by high reflectance of glass.

Rough Surface Samples

Vista Learning algorithm is specifically optimized for measuring samples with rough surfaces and severe scattering.

Transparent Film Materials

Measure transparent or semi-transparent film materials using both reflectance and transmittance channels for more comprehensive data.

Ready to Upgrade Your Measurement Solution?

Contact us for detailed information and quotes on the NS-Vista Dual-Channel Film Thickness Meter. Our experts will provide one-on-one consultation services.