Innovative film thickness measurement solution designed for flexible materials and curved substrates, breaking through limitations of traditional measurement technology.
NS-Flex integrates multiple innovative technologies from Acuitik, providing complete film thickness measurement solutions for flexible materials and complex curved surfaces
Specially designed for flexible materials, can measure thin films on curved, bent and irregular shaped substrates
Measurement accuracy up to ±0.3nm, maintaining excellent measurement stability on complex surfaces
Single point measurement in just 2 seconds, supporting rapid scanning of large-area flexible samples
Supports reflection, transmission and polarization measurement modes
NS-Flex Portable Multi-Modal Film Thickness Gauge detailed specifications
| Parameter | Specification |
|---|---|
| Measurement Principle | White Light Interferometry |
| Measurement Range | 1nm - 15μm |
| Accuracy | ±0.3nm |
| Repeatability | ±0.2nm |
| Measurement Speed | 2 seconds/point |
| Spot Size | 15μm - 80μm |
| Curvature Radius Range | 5mm - ∞ (Flat) |
| Device Dimensions | 280mm × 220mm × 320mm |
| Weight | Approx. 8kg |
| Interfaces | USB 3.0, Ethernet, WiFi |
NS-Flex Portable Multi-Modal Film Thickness Gauge is widely used in various flexible material, complex surface, solid and liquid film measurement scenarios
Measuring thin film thickness in flexible OLED, flexible solar cells and other flexible electronic products, supporting flexible display technology R&D.
Measuring coating thickness on curved surfaces of lenses, prisms and other optical components, ensuring optical performance meets design requirements.
Measuring coating and thin film thickness on surfaces of implantable medical devices, biosensors and other biomedical devices.
Contact our sales team to learn more about NS-Flex Portable Multi-Modal Film Thickness Gauge details and customization options